We present a new local tomographic algorithm applicable to electron microscope tomography. Our algorithm applies to the standard data acquisition method, single-axis tilting, as well as to more arbitrary acquisition methods including double axis and conical tilt. Using microlocal analysis we put the reconstructions in a mathematical context, explaining which singularities are stably visible from the limited data given by the data collection protocol in the electron microscope. Finally, we provide reconstructions of real specimens from electron tomography data.