Deterministic nanoassembly may enable unique integrated on-chip quantum photonic devices. Such integration requires a careful large-scale selection of nanoscale building blocks such as solid-state single-photon emitters by means of optical characterization. Second-order autocorrelation is a cornerstone measurement that is particularly time-consuming to realize on a large scale. Supervised machine learning-based classification of quantum emitters as “single” or “not-single” is implemented based on their sparse autocorrelation data. The method yields a classification accuracy of 95% within an integration time of less than a second, realizing roughly a 100-fold speedup compared to the conventional Levenberg–Marquardt fitting approach. It is anticipated that machine learning-based classification will provide a unique route to enable rapid and scalable assembly of quantum nanophotonic devices.