Open this publication in new window or tab >>2005 (English)In: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 76, no 8, p. 083710-Article in journal (Refereed) Published
Abstract [en]
Presented here is a novel technique for the in situ calibration and measurement of friction with the atomic force microscope that can be applied simultaneously with the normal force measurement. The method exploits the fact that the cantilever sits at an angle of about 10 degrees to the horizontal, which causes the tip (or probe) to slide horizontally over the substrate as a normal force run is performed. This sliding gives rise to an axial friction force (in the axial direction of the cantilever), which is measured through the difference in the constant compliance slopes of the inward and outward traces. Traditionally, friction is measured through lateral scanning of the substrate, which is time consuming, and requires an ex situ calibration of both the torsional spring constant and the lateral sensitivity of the photodiode detector. The present method requires no calibration other than the normal spring constant and the vertical sensitivity of the detector, which is routinely done in the force analysis. The present protocol can also be applied to preexisting force curves, and, in addition, it provides the means to correct force data for cantilevers with large probes.
Keywords
TORSIONAL SPRING CONSTANT; ADHESION MEASUREMENTS; CANTILEVERS; SURFACTANT; MONOLAYERS; TILT
National Category
Chemical Sciences
Identifiers
urn:nbn:se:kth:diva-9078 (URN)10.1063/1.2006407 (DOI)000231276600035 ()2-s2.0-26444462128 (Scopus ID)
Note
Correction in: Review of Scientific Instruments, Volume 77, Issue 1, Doi: 10.1063/1.2162429, WOS: 000234979400044, QC 20100824
2006-02-102006-02-102022-06-25Bibliographically approved