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Heterogeneous transfer bonding for wafer-level MEMS integration
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0002-4867-0391
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0002-6811-590X
KTH, School of Electrical Engineering and Computer Science (EECS), Micro and Nanosystems.ORCID iD: 0000-0002-2752-7422
Department of Electrical and Electronic Engineering, University of Bristol, U.K., United Kingdom.
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2026 (English)In: 2026 9th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2026, Institute of Electrical and Electronics Engineers (IEEE) , 2026, p. 14O11-Conference paper, Published paper (Refereed)
Abstract [en]

We developed a transfer bonding method for large-scale integration of MEMS devices directly on standard CMOS foundry wafers, enabling novel applications of sophisticated, programmable MEMS circuits. Further, we developed a hermetic sealing process, also based on wafer-level transfer bonding, to protect the MEMS devices.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2026. p. 14O11-
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-385393DOI: 10.1109/LTB-3D69101.2026.11555294Scopus ID: 2-s2.0-105043460050OAI: oai:DiVA.org:kth-385393DiVA, id: diva2:2086289
Conference
9th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2026, Kanazawa, Japan, May 13 2026 - May 15 2026
Note

Part of ISBN 9798331584351

QC 20260713

Available from: 2026-07-13 Created: 2026-07-13 Last updated: 2026-07-13Bibliographically approved

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Bleiker, Simon J.Li, YingyingJo, GaehunGylfason, KristinnNiklaus, Frank

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  • apa
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  • de-DE
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