RAP-NoC: Reliability Assessment of Photonic Network-on-Chips, A simulator
2021 (English) In: Proceedings of the 8th ACM international conference on nanoscale computing and communication (ACM NANOCOM 2021), Association for Computing Machinery (ACM) , 2021Conference paper, Published paper (Refereed)
Abstract [en]
Nowadays, optical network-on-chip is accepted as a promising alternative solution for traditional electrical interconnects due to lower transmission delay and power consumption as well as considerable high data bandwidth. However, silicon photonics struggles with some particular challenges that threaten the reliability of the data transmission process.The most important challenges can be considered as temperature fluctuation, process variation, aging, crosstalk noise, and insertion loss. Although several attempts have been made to investigate the effect of these issues on the reliability of optical network-on-chip, none of them modeled the reliability of photonic network-on-chip in a system-level approach based on basic element failure rate. In this paper, an analytical model-based simulator, called Reliability Assessment of Photonic Network-on-Chips (RAP-NoC), is proposed to evaluate the reliability of different 2D optical network-on-chip architectures and data traffic. The experimental results show that, in general, Mesh topology is more reliable than Torus considering the same size. Increasing the reliability of Microring Resonator (MR) has a more significant impact on the reliability of an optical router rather than a network.
Place, publisher, year, edition, pages Association for Computing Machinery (ACM) , 2021.
Keywords [en]
Photonic network-on-chip, Microring resonator, RBD, Reliability
National Category
Computer Engineering
Identifiers URN: urn:nbn:se:kth:diva-310242 DOI: 10.1145/3477206.3477455 ISI: 000759790800011 Scopus ID: 2-s2.0-85115729032 OAI: oai:DiVA.org:kth-310242 DiVA, id: diva2:1647165
Conference 8th ACM International Conference on Nanoscale Computing and Communication (ACM NANOCOM), SEP 07-09, 2021, ELECTR NETWORK
Note Part of proceedings ISBN 978-1-4503-8710-1
QC 20220325
2022-03-252022-03-252023-01-18 Bibliographically approved