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Long-term durability of commercial capacitive deionization modules
KTH, School of Engineering Sciences (SCI), Applied Physics, Materials and Nanophysics.ORCID iD: 0000-0003-3081-8527
Stockholm Water Technology AB, Stockholmsvägen 116B, 187 30 Täby, Sweden, Stockholmsvägen 116B.
KTH, School of Engineering Sciences (SCI), Applied Physics, Materials and Nanophysics.ORCID iD: 0000-0002-0074-3504
2024 (English)In: Desalination, ISSN 0011-9164, E-ISSN 1873-4464, Vol. 576, article id 117377Article in journal (Refereed) Published
Abstract [en]

Long-term durability is becoming increasingly relevant for capacitive deionization (CDI) as the technology emerges on the commercial scale. Short-term deionization studies have suggested that Faradaic leakages could be a major factor in electrode degradation, but the long-term effects are still unclear. In this study, we probe the degradation process of the desalination efficiency in commercial CDI modules for up to 52 days of non-stop operation. This corresponds to a little more than 100 m3 of water treated, and the lifetime production volume of the modules is estimated between 150,000–250,000 L of purified water. Surprisingly, the results demonstrate that the absolute long-term loss is largely linear with the cumulative charge leakage. This suggests short-term leakage currents could reasonably predict long-term degradation. Interestingly, the absolute loss mechanisms mean devices with higher total capacitance are more degradation resistant. Finally, shortening cycle times and other methods of reducing leakage would lead to a proportionally longer lifetime. Notably, the first 2 min of the 10 min operation retained 50 % of the performance with only 10 % of the leakage (10-fold reduction). In conclusion, the work provides a method for understanding, predicting, and reducing degradation in long-term operations with commercial CDI modules.

Place, publisher, year, edition, pages
Elsevier BV , 2024. Vol. 576, article id 117377
Keywords [en]
Capacitive deionization, Degradation, Desalination, Durability, Modeling, Upscaling
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Identifiers
URN: urn:nbn:se:kth:diva-343196DOI: 10.1016/j.desal.2024.117377ISI: 001173189900001Scopus ID: 2-s2.0-85183518190OAI: oai:DiVA.org:kth-343196DiVA, id: diva2:1836098
Note

QC 20240209

Available from: 2024-02-08 Created: 2024-02-08 Last updated: 2024-03-26Bibliographically approved

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Nordstrand, JohanDutta, Joydeep

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