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Fast complete Mueller matrix polarimetry microscopy using a single polarization camera
Centre for Optical and Electromagnetic Research, Ningbo Innovation Center, College of Optical Science and Engineering, National Engineering Research Center for Optical Instruments, Zhejiang University, Hangzhou 310058, China.
Centre for Optical and Electromagnetic Research, Ningbo Innovation Center, College of Optical Science and Engineering, National Engineering Research Center for Optical Instruments, Zhejiang University, Hangzhou 310058, China; Ningbo Research Institute, Ningbo Innovation Center, Zhejiang University, Ningbo 315100, China.
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electromagnetic Engineering and Fusion Science. Centre for Optical and Electromagnetic Research, Ningbo Innovation Center, College of Optical Science and Engineering, National Engineering Research Center for Optical Instruments, Zhejiang University, Hangzhou 310058, China; Ningbo Research Institute, Ningbo Innovation Center, Zhejiang University, Ningbo 315100, China.ORCID iD: 0000-0002-3401-1125
2025 (English)In: Optics and lasers in engineering, ISSN 0143-8166, E-ISSN 1873-0302, Vol. 184, article id 108650Article in journal (Refereed) Published
Abstract [en]

We propose a fast microscopic polarimeter for complete Mueller matrix imaging by using two rotating retarders and one polarization camera. Our new design allows us to compute the full Mueller matrix by 6 measurements in only ∼1.4s. The acquisition time is reduced by optimizing the sampling process. At the same time, the measurement precision is enhanced by minimizing the conditional numbers of the measurement matrices, compensating the pixel displacement, and calibrating the orientation of each polarization component in the system. As a demonstration, we use our fast polarimetry microscopy to measure the complete Mueller matrix for a garnet sample and cholesteric liquid crystal samples.

Place, publisher, year, edition, pages
Elsevier Ltd , 2025. Vol. 184, article id 108650
Keywords [en]
condition number, fast microscopic polarimetry, full Mueller matrix imaging, polarization camera
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-355943DOI: 10.1016/j.optlaseng.2024.108650ISI: 001348815600001Scopus ID: 2-s2.0-85207330072OAI: oai:DiVA.org:kth-355943DiVA, id: diva2:1911109
Note

QC 20241119

Available from: 2024-11-06 Created: 2024-11-06 Last updated: 2024-11-19Bibliographically approved

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He, Sailing

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